Optical contamination control in the Advanced LIGO ultra-high vacuum system

Document #:

LIGO-P1300192-v2

Document type:

P - Publications

Abstract:

" Optical contamination control in the Advanced LIGO ultra-high vacuum system ", Proc. SPIE 8885, Laser-Induced Damage in Optical Materials: 2013, 88852E (November 14, 2013); doi:10.1117/12.2047327

NOTE - For latest information on PCL's on wafers from chamber refer to LIGO-G1400142: Summary of 4" Wafer Data. PCL's from wafer data in this talk has an error and is now also out of date. CC team investigating error. Calum Torrie

Files in Document:

• Optical Contamination Control in Advanced LIGO.pdf (1.3 MB)

Other Files:

• Optical Contamination Control in Advanced LIGO.doc (10.6 MB)

Topics:

• System Engineering
• Core Optics

Authors:

• Margot Hennig
• Kaitlin Gushwa
• Calum Torrie

Keywords:

contamination control SPIE

Related Documents:

• LIGO-T1300511: Particulate Contamination Requirements
• LIGO-E0900047: LIGO Contamination Control Plan
• LIGO-E960022: LIGO Clean and Bake Methods and Procedures
• LIGO-T060161: Test of First Contact™ Strippable Material
• LIGO-E1000128: FTIR: First Contact with PEEK mesh
• LIGO-T0900438: LIGO Vacuum Qualification of First Contact™
• LIGO-T1000137: Drag Wiping and First Contact

Referenced by:

• LIGO-E1400258-v3: Contamination Control Mitigation Processes and the resulting Cleanliness Levels
• LIGO-E1400028: aLIGO, Particulate Contamination Talks, Papers and Posters