Wafer Photo Test
- Document #:
- LIGO-T1300662-v1
- Document type:
- T - Technical notes
Other Versions:
- Abstract:
- Pictures of a very dirty 4" wafer were taken to see how a DSLR would perform this task.
The camera was 48" above the wafer. The 600 lumen LED light source was 58" away at a 13° angle.
Exposure compensation was used to decrease and increase the exposure time. The - and + postscripts on the file names are in full stops of exposure compensation.
Both JPG and NEF (Nikon's raw format) are included.
- Files in Document:
-
- DSC_8638_0.JPG (file is not accessible)
- Other Files:
- DSC_8638_0.NEF (file is not accessible)
- DSC_8639_-1.JPG (file is not accessible)
- DSC_8639_-1.NEF (file is not accessible)
- DSC_8640_-2.JPG (file is not accessible)
- DSC_8640_-2.NEF (file is not accessible)
- DSC_8641_+1.JPG (file is not accessible)
- DSC_8641_+1.NEF (file is not accessible)
- DSC_8642_+2.JPG (file is not accessible)
- DSC_8642_+2.NEF (file is not accessible)
- DSC_8643_+3.JPG (file is not accessible)
- DSC_8643_+3.NEF (file is not accessible)
- DSC_8644_+4.JPG (file is not accessible)
- DSC_8644_+4.NEF (file is not accessible)
- Topics:
- Authors:
- Notes and Changes:
- All pictures taken with a Nikon D300 and Nikon 18-300 lens.
Settings:
ISO: 200
f/stop: 8
shutter speed: various
VR(lens) off
- Referenced by:
- LIGO-T1300673-v1: Mobility Mock-up at CIT of T1300456 Wafer