Errors on the Cryogenic Mechanical Loss Measurement in Cantilever Ring-down Method

Document #:

LIGO-G1700301-v1

Document type:

G - Presentations (eg Graphics)

Abstract:

We report here, based on our repeated measurements on various kind of thin film samples on silicon cantilevers, error patterns of cryogenic mechanical loss measurement in cantilever ring-down method from 10K to room temperature. We found that the measured cryogenic loss is highly repeatable with temperature re-cycling from 10K to room temperature. While on re-clamping, the measured loss is highly repeatable from 10K to ~100K, but less repeatable at elevated temperature; non-repeatable loss peaks appear with different clamping at the elevated temperature[1]. With careful alignment during the sample-clamp assembling process, problem improved. Re-clamping with careful alignment is necessary to ensure that the peaks presented in the temperature range above ~100K are real.

Files in Document:

• 20170307 Errors on the Cryogenic Mechanical Loss Measu...pdf (file is not accessible)

Topics:

• Meeting

Authors:

• Ling-Chi Kuo
• Huang-wei Pan
• Shiuh Chao

Keywords:

Cryogenic Cantilever Ring-down