ETM Low Voltage Low Noise Electro-Static Driver Test Procedure

Document #:

LIGO-E1500208-v3

Document type:

E - Engineering documents

Abstract:

A test procedure for the chassis level checkout of the D1500129 chassis

Files in Document:

• PDF Version (LNLVDriverTest_v3.pdf, file is not accessible)

Other Files:

• Word Version (LNLVDriverTest_v3.docx, file is not accessible)

Topics:

• Sensing and Control

Authors:

• Rich Abbott

Keywords:

ESD

Notes and Changes:

Version 2:
1. Fixed typo on voltage labels in section 2.1 as pertains to the +/-15V and +/- V measurements
2. Expanded allowable phase on Table 14 to permit 5 degrees of variation vs. 3 degrees

Version 3:
Changed expected values of transfer functions to reflect ECR E1500341 component value changes.

Related Documents:

• LIGO-E1500341: ECR - LV ESD Driver Component Changes